A data-driven approach to improving capacity utilization of semiconductor test equipment
Citable URI:
http://hdl.handle.net/1721.1/10567
| Title: | A data-driven approach to improving capacity utilization of semiconductor test equipment |
| Author: | Bailey, Roberta L. (Roberta Lynn) |
| Advisor: | Charles Sodini, Stephen Graves. |
| Department: | Sloan School of Management |
| Publisher: | Massachusetts Institute of Technology |
| Issue Date: | 1996 |
| Description: |
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996. Includes bibliographical references (p. 77). |
| URI: | http://hdl.handle.net/1721.1/10567 |
| Keywords: | Sloan School of Management |
Files in this item
| Files | Size | Format | View | Description |
|---|---|---|---|---|
| Preview, non-printable (open to all) | 7.771Mb |
View/ |
Preview, non-printable (open to all) | |
| Full printable version (MIT only) | 7.771Mb |
View/ |
Full printable version (MIT only) |
This item appears in the following Collection(s)
All Items in DSpace@MIT are protected by original copyright, with all rights reserved, unless otherwise indicated.
|
|
Contact
MIT Libraries
|