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A data-driven approach to improving capacity utilization of semiconductor test equipment

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dc.contributor.advisor Charles Sodini, Stephen Graves. en_US
dc.contributor.author Bailey, Roberta L. (Roberta Lynn) en_US
dc.date.accessioned 2005-08-18T16:55:24Z
dc.date.available 2005-08-18T16:55:24Z
dc.date.copyright 1996 en_US
dc.date.issued 1996 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/10567
dc.description Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996. en_US
dc.description Includes bibliographical references (p. 77). en_US
dc.description.statementofresponsibility by Roberta L. Bailey. en_US
dc.format.extent 88 p. en_US
dc.format.extent 7771489 bytes
dc.format.extent 7771243 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582
dc.subject Sloan School of Management en_US
dc.title A data-driven approach to improving capacity utilization of semiconductor test equipment en_US
dc.type Thesis en_US
dc.description.degree M.S. en_US
dc.contributor.department Sloan School of Management en_US
dc.identifier.oclc 36028585 en_US


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