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Analytical studies of the generalized likelikhood ratio technique for failure detection

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Analytical studies of the generalized likelikhood ratio technique for failure detection

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Author: Massachusetts Institute of Technology. Electronic Systems Laboratory.; Chow, Edward Yik.
Publisher: Electronic Systems Laboratory, Massachusetts Institute of Technology
Date Issued: 1976
Description:
Includes bibliographical references.Originally presented as author's thesis (M.S.--Masschusetts Insitute of Technology), 1976.
URI: http://hdl.handle.net/1721.1/1257
Other Identifiers: 645
Series/Report no.: Report (Massachusetts Institute of Technology. Electronic Systems Laboratory) ; ESL-R-645.
Keywords: TK7855.M41 E386 no.645, Control theory, System analysis

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