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Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing
(Massachusetts Institute of Technology, 1995)
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Author
Haag, Lance Edward (1)
Department
Department of Electrical Engineering and Computer Science (1)
Sloan School of Management (1)
DegreeM.S. (1)SubjectElectrical Engineering and Computer Science (1)
Sloan School of Management (1)
... View MoreDate Issued
1995 (1)
Has File(s)Yes (1)