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Now showing items 11-20 of 52

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Product development process modeling and analysis of digital wireless telephones 

Pinkett, Randal D. (Randal Dike), 1971- (Massachusetts Institute of Technology, 1998)
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The coupling of product architecture and organizational structure decisions 

Gulati, Rosaline K (Massachusetts Institute of Technology, 1996)
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Semiconductor fabrication capacity gains through optimal allocation of product loadings and equipment sharing across process technologies 

Muir, Stephen H (Massachusetts Institute of Technology, 1997)
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Cost effect of uniquely designed component choices of over the product life of a workstation 

Di Censo, Anne Paige (Massachusetts Institute of Technology, 1997)
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Improving production testing of RF products in a noisy measurement environment 

Myers, M. Parker (Marion Parker) (Massachusetts Institute of Technology, 1996)
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Technology transfer as invention and innovation : a case study on hybrid power supplies 

Waldorf, Beverly M. (Beverly Mary) (Massachusetts Institute of Technology, 1991)
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Product development process postmortem assessment 

Kacandes, Peter N (Massachusetts Institute of Technology, 1997)
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Applying Critical Chain to improve the management of uncertainty in projects 

Cook, Stephen Carl, 1966- (Massachusetts Institute of Technology, 1998)
In an ever intensifying global competitive market, the management of projects, particularly product development efforts, increasingly is one of the few areas which can produce a sustained competitive advantage. Firms that ...
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Knowledge transfer between semiconductor fabrication facility startups 

Braum, Roberta M. (Roberta Michelle), 1971- (Massachusetts Institute of Technology, 1999)
A reduction in the time and resources required for startup and ramp of a semiconductor fabrication facility is necessary to maintain competitiveness in manufacturing operations. This research describes and examines a method ...
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Reduction of process monitoring in semiconductor chip manufacturing 

Amar, Ajay, 1964- (Massachusetts Institute of Technology, 1999)
This thesis concerns in-line inspection scheduling policies in semiconductor chip manufacturing. Intel uses extensive monitoring (inspections) in the manufacturing process. While the inspections help safeguard process ...
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AuthorAltman, Arthur H (1)Amar, Ajay, 1964- (1)Bailey, Troy A (1)Berkery, Daniel J. (Daniel John) (1)Black, Brian E. (Brian Edward), 1967- (1)Braum, Roberta M. (Roberta Michelle), 1971- (1)Brennan, Catherine M. (Catherine Marie) (1)Bronson, Darren (Darren Frazier), 1970- (1)Capelle, Michael J. (Michael John) (1)Chao, Jackson Sheng-Kuang (1)... View MoreDepartmentDepartment of Electrical Engineering and Computer Science (52)Sloan School of Management (52)Operations Research Center (1)DegreeM.S. (33)S.M. (19)M.B.A. (8)M.S (1)Subject
Electrical Engineering and Computer Science (52)
Sloan School of Management (52)
... View MoreDate Issued1997 (12)1998 (12)1999 (8)1995 (5)1996 (5)1991 (3)1994 (3)1992 (2)1993 (2)Has File(s)Yes (52)

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