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Now showing items 31-40 of 196
Increasing experiment velocity in a production environment
(Massachusetts Institute of Technology, 1999)
Applying run-by-run process control to chemical-mechanical planarization and assessing insertion costs versus benefits of CMP
(Massachusetts Institute of Technology, 1995)
Implications and implementation of manufacturing cycle time reduction
(Massachusetts Institute of Technology, 1997)
Adapting communication structures for globally-networked manufacturing organizations
(Massachusetts Institute of Technology, 1997)
Semiconductor cluster tool availability
(Massachusetts Institute of Technology, 1994)
Balancing flexibility and formality in product development at a high growth technology company
(Massachusetts Institute of Technology, 1998)
Increased semiconductor fabrication capacity through cross-site processing
(Massachusetts Institute of Technology, 1998)
Supply chain modeling for inventory analysis
(Massachusetts Institute of Technology, 1997)
Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing
(Massachusetts Institute of Technology, 1995)
Deep Learning Models of Scanner/Vision Tunnel Performance in Sortation Subsystems
(Massachusetts Institute of Technology, 2021-06)
We propose an end-to-end process and tool to deep-dive scanner issues at Amazon’s sorter sites, allowing us to categorize no-reads into operational issues or actual equipment issues.
Our tool sends no-read scanner images ...