Advanced Search
DSpace@MIT

Measurement of adhesion and mechanical properties of thin films using microfabricated structures

Research and Teaching Output of the MIT Community

Show simple item record

dc.contributor.advisor Stephen D. Senturia. en_US
dc.contributor.author Allen, Mark George en_US
dc.contributor.other Massachusetts Institute of Technology. Dept. of Chemical Engineering. en_US
dc.date.accessioned 2005-08-10T15:49:26Z
dc.date.available 2005-08-10T15:49:26Z
dc.date.copyright 1989 en_US
dc.date.issued 1989 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/14329
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Chemical Engineering, 1989. en_US
dc.description Includes bibliographical references (leaves 188-193). en_US
dc.description.statementofresponsibility by Mark George Allen. en_US
dc.format.extent 193 leaves en_US
dc.format.extent 13883150 bytes
dc.format.extent 13882908 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582
dc.subject Chemical Engineering. en_US
dc.title Measurement of adhesion and mechanical properties of thin films using microfabricated structures en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Chemical Engineering. en_US
dc.identifier.oclc 21885566 en_US


Files in this item

Name Size Format Description
21885566.pdf 13.24Mb PDF Preview, non-printable (open to all)
21885566-MIT.pdf 13.23Mb PDF Full printable version (MIT only)

This item appears in the following Collection(s)

Show simple item record

MIT-Mirage