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Random field modeling for interpretation and analysis of layered data

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dc.contributor.advisor Alan Willsky. en_US
dc.contributor.author Bunks, Carey David en_US
dc.contributor.other Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.date.accessioned 2005-08-08T18:24:53Z
dc.date.available 2005-08-08T18:24:53Z
dc.date.copyright 1987 en_US
dc.date.issued 1987 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/14930
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1987. en_US
dc.description MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING en_US
dc.description Bibliography: leaves 288-290. en_US
dc.description.statementofresponsibility by Carey David Bunks. en_US
dc.format.extent 290 leaves en_US
dc.format.extent 24652796 bytes
dc.format.extent 24652550 bytes
dc.format.mimetype application/pdf
dc.format.mimetype application/pdf
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582
dc.subject Electrical Engineering and Computer Science. en_US
dc.title Random field modeling for interpretation and analysis of layered data en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.identifier.oclc 16528452 en_US


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