Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan
Citable URI:
http://hdl.handle.net/1721.1/17109
| Title: | Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
| Author: | Finan, William F |
| Other Contributors: | MIT Japan Program. |
| Publisher: | MIT Japan Program, Massachusetts Institute of Technology |
| Issue Date: | 1993 |
| Description: | Includes bibliographical references. |
| URI: | http://hdl.handle.net/1721.1/17109 |
| Other Identifiers: | 93-01 |
| Series/Report no.: | MITJP (Series) ; 93-01. |
| Keywords: | Q180.J3 M22 no.93-01 |
Files in this item
| Files | Size | Format |
|---|---|---|
| JP-WP-93-01-27732004.pdf | 2.480Mb | application/pdf |
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