| dc.contributor |
Finan, William F |
en_US |
| dc.contributor.other |
MIT Japan Program. |
en_US |
| dc.date.accessioned |
2005-06-01T15:20:05Z |
|
| dc.date.available |
2005-06-01T15:20:05Z |
|
| dc.date.issued |
1993 |
en_US |
| dc.identifier.other |
93-01 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/17109 |
|
| dc.description |
Includes bibliographical references. |
en_US |
| dc.description.provenance |
Made available in DSpace on 2005-06-01T15:20:05Z (GMT). No. of bitstreams: 1
JP-WP-93-01-27732004.pdf: 2480874 bytes, checksum: aedec9f1cdd32965eaac24156b7cf7c7 (MD5)
Previous issue date: 1993 |
en |
| dc.description.statementofresponsibility |
William F. Finan. |
en_US |
| dc.format.extent |
31 p. |
en_US |
| dc.format.extent |
2480874 bytes |
|
| dc.format.mimetype |
application/pdf |
|
| dc.language.iso |
eng |
en_US |
| dc.publisher |
MIT Japan Program, Massachusetts Institute of Technology |
en_US |
| dc.relation.ispartofseries |
MITJP (Series) ; 93-01. |
en_US |
| dc.subject.lcc |
Q180.J3 M22 no.93-01 |
en_US |
| dc.title |
Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan |
en_US |
