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Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

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dc.contributor Finan, William F en_US
dc.contributor.other MIT Japan Program. en_US
dc.date.accessioned 2005-06-01T15:20:05Z
dc.date.available 2005-06-01T15:20:05Z
dc.date.issued 1993 en_US
dc.identifier.other 93-01 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/17109
dc.description Includes bibliographical references. en_US
dc.description.statementofresponsibility William F. Finan. en_US
dc.format.extent 31 p. en_US
dc.format.extent 2480874 bytes
dc.format.mimetype application/pdf
dc.language.iso eng en_US
dc.publisher MIT Japan Program, Massachusetts Institute of Technology en_US
dc.relation.ispartofseries MITJP (Series) ; 93-01. en_US
dc.subject.lcc Q180.J3 M22 no.93-01 en_US
dc.title Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan en_US


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