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An analysis of SIFT object recognition with an emphasis on landmark detection

Author(s)
Ross, Benjamin Charles
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Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Advisor
Trevor J. Darrell.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
In this thesis, I explore the realm of feature-based object. recognition applied to landmark detection. I have built a system using SIFT object recognition and Locality-Sensitive Hashing to quickly and accurately detect landmarks with accuracies ranging from 85-95%. I have also compared PCA-SIFT, a newly developed feature descriptor, to SIFT, and have found that SIFT outperforms it only particular data set. In addition, I have, performed a relatively extensive empirical comparison between Locality-Sensitive Hashing and Best-Bin First, two approximate nearest neighbor searches, finding that Locality-Sensitive Hashing in general performs the best.
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.
 
Includes bibliographical references (p. 109-110).
 
Date issued
2004
URI
http://hdl.handle.net/1721.1/33341
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.

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