Advanced Search
DSpace@MIT

Aligning tool set metrics for operation in a Multi Technology High Mix Low Volume manufacturing environment

Research and Teaching Output of the MIT Community

Aligning tool set metrics for operation in a Multi Technology High Mix Low Volume manufacturing environment

Download
Author: Naughton, Alyson B. (Alyson Bourne)
Other Contributors: Leaders for Manufacturing Program.
Advisor: Roy E. Welsch and Daniel Whitney.
Department: Sloan School of Management.; Massachusetts Institute of Technology. Dept. of Mechanical Engineering.; Leaders for Manufacturing Program.
Publisher: Massachusetts Institute of Technology
Date Issued: 2005
Abstract:
Ireland Fab Operations (IFO) is transitioning and leading the way within Intel to Multi- Technology High Mix Low Volume (MT-HMLV) manufacturing. To avoid errors in estimating metrics, specific capacity tool set metrics for this manufacturing environment now need to be considered. Approximations for high volume manufacturing may be far enough from MT-HMLV realities that company revenue is affected by making delivery commitments that can not be met. The Intel Model of Record (MOR) which is used to determine the number of each tool set needed to produce a given volume of product does not consider MT-HMLV realities. Things such as product change-overs, cross qualified tools, and smaller than 'normal' lot sizes can create chaos on the manufacturing floor that has not been traditionally accounted for.
Description:
Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2005.Includes bibliographical references (p. 81).
URI: http://hdl.handle.net/1721.1/34852
Keywords: Sloan School of Management., Mechanical Engineering., Leaders for Manufacturing Program.

Show full item metadata

Files in this item

Name Size Format Description
63199950.pdf 3.265Mb PDF Preview, non-printable (open to all)
63199950-MIT.pdf 3.268Mb PDF Full printable version (MIT only)

This item appears in the following Collection(s)

MIT-Mirage