12.141 Electron Microprobe Analysis, January (IAP) 2003
Citable URI:
http://hdl.handle.net/1721.1/35789
| Title: | 12.141 Electron Microprobe Analysis, January (IAP) 2003 |
| Author: | Chatterjee, Nilanjan; Grove, Timothy L. |
| Issue Date: | 2003-01 |
| Abstract: | Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. |
| URI: | http://hdl.handle.net/1721.1/35789 |
| Other Identifiers: | 12.141-January(IAP)2003 |
| Other Identifiers: | 12.141 IMSCP-MD5-93cae862f67ea8a9184486512eb71a72 |
| Keywords: | x-ray microanalysis, electron microprobe, ZAF matrix corrections, wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, X-ray imaging, Microprobe analysis, 400601, Geology/Earth Science, General |
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| 12-141January-- ... -2003/CourseHome/index.htm | 15.03Kb | text/html |
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Earth, Atmospheric, and Planetary Sciences (12) -
Earth, Atmospheric, and Planetary Sciences (12)
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