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12.141 Electron Microprobe Analysis, January (IAP) 2003

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12.141 Electron Microprobe Analysis, January (IAP) 2003

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Alternative Title: Electron Microprobe Analysis
Author: Chatterjee, Nilanjan; Grove, Timothy L.
Date Issued: 2003-01
Abstract:
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.
URI: http://hdl.handle.net/1721.1/35789
Other Identifiers: 12.141-January(IAP)2003
Other Identifiers: 12.141
IMSCP-MD5-93cae862f67ea8a9184486512eb71a72
Keywords: x-ray microanalysis, electron microprobe, ZAF matrix corrections, wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, X-ray imaging, Microprobe analysis, 400601, Geology/Earth Science, General

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