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dc.contributor.advisorStephen Graves and Duane Boning.en_US
dc.contributor.authorSubramanian, Nimaen_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2007-12-07T16:07:03Z
dc.date.available2007-12-07T16:07:03Z
dc.date.copyright2007en_US
dc.date.issued2007en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/39686
dc.descriptionThesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; in conjunction with the Leaders for Manufacturing Program at MIT, 2007.en_US
dc.descriptionIncludes bibliographical references (p. 60-61).en_US
dc.description.abstractIntel Corporation's Fab17 located at Hudson, MA underwent a large scale manufacturing ramp-up, increasing its production volume by over 50%. As a result of this manufacturing ramp-up, the factory is faced with various capacity issues. These capacity issues along with current work-in-progress inventory (WIP) management strategies lead to an unbalanced inventory flow within the factory. The unbalanced WIP flow results in wafers accumulating in front of certain operations/areas. This WIP accumulation or "WIP bubbles" creates unexpected demand for the various resources on the shop floor, putting an undue strain on them. This strain is felt the most in the bottleneck area. The objective of this project is to develop a sustainable solution methodology to alleviate the strain on the bottleneck. The scope of this project falls under Fab 17's lean manufacturing organization, known as the manufacturing excellence (mX) group, and, the analysis used in this internship utilizes lean manufacturing concepts and principles. The solution methodology analyzes the wafer fabrication process in layers rather than in segments. This approach clarifies WIP movement and identifies problem areas that cause WIP bubbles. Further, the thesis applies the concept of production leveling to wafer fabrication in order to alleviate (and eliminate) the pressure on the bottleneck.en_US
dc.description.statementofresponsibilityby Nima Subramanian.en_US
dc.format.extent61 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectSloan School of Management.en_US
dc.subjectMechanical Engineering.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleLean manufacturing in a semiconductor environment : production levelingen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.description.degreeM.B.A.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.contributor.departmentSloan School of Management
dc.identifier.oclc175304158en_US


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