| dc.contributor.advisor |
John G. Trump. |
en_US |
| dc.contributor.author |
Bullington, Robert Kenneth |
en_US |
| dc.date.accessioned |
2008-05-19T16:18:06Z |
|
| dc.date.available |
2008-05-19T16:18:06Z |
|
| dc.date.issued |
1937 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/41791 |
|
| dc.description |
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1937. |
en_US |
| dc.description |
MICROFICHE COPY AVAILABLE IN ENGINEERING. |
en_US |
| dc.description |
Includes bibliographical references (leaf 16). |
en_US |
| dc.description.provenance |
Made available in DSpace on 2008-05-19T16:18:06Z (GMT). No. of bitstreams: 2
35394783.pdf: 1292405 bytes, checksum: 881b424c360bfe15ef367e6f00d22781 (MD5)
35394783-MIT.pdf: 1292219 bytes, checksum: ac2b915c475480dae3379e70e3305fb0 (MD5)
Previous issue date: 1937 |
en |
| dc.description.statementofresponsibility |
by Robert Kenneth Bullington. |
en_US |
| dc.format.extent |
16, [5] leaves |
en_US |
| dc.language.iso |
eng |
en_US |
| dc.publisher |
Massachusetts Institute of Technology |
en_US |
| dc.rights |
M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. |
en_US |
| dc.rights.uri |
http://dspace.mit.edu/handle/1721.1/7582 |
en_US |
| dc.subject |
Electrical Engineering |
en_US |
| dc.title |
Portable direct-reading x-ray intensity meter |
en_US |
| dc.type |
Thesis |
en_US |
| dc.description.degree |
M.S. |
en_US |
| dc.contributor.department |
Massachusetts Institute of Technology. Dept. of Electrical Engineering |
en_US |
| dc.identifier.oclc |
35394783 |
en_US |
