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Dynamic nanometer alignment for nanofabrication and metrology

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Title: Dynamic nanometer alignment for nanofabrication and metrology
Author: Moon, Euclid E. (Euclid Eberle), 1965-
Advisor: Henry I. Smith.
Department: Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science
Publisher: Massachusetts Institute of Technology
Issue Date: 1998
Description: Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.Includes bibliographical references (leaves 163-164).
URI: http://hdl.handle.net/1721.1/41799
Keywords: Electrical Engineering and Computer Science

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