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A technique for the measurement of the far-infrared radiative properties of metal and superconducting thin films

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dc.contributor.advisor Ernest G. Cravalho. en_US
dc.contributor.author Malone, Christopher Gregory, 1967- en_US
dc.date.accessioned 2008-11-07T20:12:00Z
dc.date.available 2008-11-07T20:12:00Z
dc.date.copyright 1997 en_US
dc.date.issued 1997 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/43559
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1997. en_US
dc.description Includes bibliographical references (leaves 195-203). en_US
dc.description.statementofresponsibility by Christopher Gregory Malone. en_US
dc.format.extent 203 leaves en_US
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582 en_US
dc.subject Mechanical Engineering en_US
dc.title A technique for the measurement of the far-infrared radiative properties of metal and superconducting thin films en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Mechanical Engineering en_US
dc.identifier.oclc 38529420 en_US


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