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X-ray photoelectron spectroscopy of silicate glasses

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dc.contributor.advisor Donald R. Uhlmann. en_US
dc.contributor.author Tasker, G. William en_US
dc.contributor.other Massachusetts Institute of Technology. Dept. of Materials Science and Engineering. en_US
dc.date.accessioned 2009-11-06T16:04:15Z
dc.date.available 2009-11-06T16:04:15Z
dc.date.copyright 1987 en_US
dc.date.issued 1987 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/49574
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1987. en_US
dc.description MICROFICHE COPY AVAILABLE IN ARCHIVES AND SCIENCE. en_US
dc.description Vita. en_US
dc.description Includes bibliographies. en_US
dc.description.statementofresponsibility by G. William Tasker. en_US
dc.format.extent 241 leaves en_US
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582 en_US
dc.subject Materials Science and Engineering. en_US
dc.title X-ray photoelectron spectroscopy of silicate glasses en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Materials Science and Engineering. en_US
dc.identifier.oclc 17349587 en_US


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