Kleppner, Daniel; Pritchard, David E.; Ketterle, Wolfgang; Courtney, Michael W.; Jiao, Hong; Spellmeyer, Neal W.; Brandenberger, John R.; DeVries, Joel C.; Ducas, Theodore W.; Holley, Jeffrey R.; Lutwak, Robert I.; Bradley, Michael P.; Garrison, David; Ilic, Ljubomir M.; Palmer, Fred L.; Ripin, Daniel J.; Rusinkiewicz, Szymon M.; Chapman, Michael S.; Hammond, Troy D.; Lenef, Alan L.; Smith, Edward T.; Rubenstein, Richard A.; Schmiedmayer, H. Jorg; Kokorowski, David A.; Czachor, Marek L.; Rohwedder, Bernd S.; Jordan, Allen; van Druten, Nicolaas J.; Andrews, Michael R.; Davis, Kendall B.; Durfee, Dallin S.; Entin, Ilya A.; Hinz, Philip M.; Huang, Everest W.; Kurn, Dan M.; Mewes, Marc O.; Rosenband, Till P.; Sestok, Charles K.; Thompson, Stanley H.; Yesley, Peter S.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1995-01-01)