Allen, Jonathan; Wyatt, John L., Jr.; White, Jacob K.; Devadas, Srinivas; Armstrong, Robert C.; Baltus, Donald G.; McDonald, Robert G.; Tan, Chin Hwee; Horn, Berthold K. P.; Lee, Hae-Seung; Sodini, Charles G.; Keast, Craig L.; Masaki, Ichiro; Decker, Steven J.; Dron, Lisa G.; Elfadel, Ibrahim M.; Hakkarainen, J. Mikko; Herrmann, Frederick P.; Martin, David R.; McQuirk, Ignacio S.; Reichelt, Mark W.; Seidel, Mark N.; Silveira, Luis M.; Umminger, Christopher B.; Yu, Paul C.; Lumsdaine, Andrew; Rahmat, Khalid; Antoniadis, Dimitri A.; Cai, Xuejun; Kamon, Mattan; Yie, He; Schmidt, Martin A.; Senturia, Stephen D.; Phillips, Joel R.; van der Zant, Herre S. J.; Orlando, Terry P.; Kim, Songmin; Nabors, Keith S.; Chou, Michael T.; Korsmeyer, F. Thomas; Leeb, Steven B.; Alidina, Mazhar M.; Bhagwati, Vishal L.; Liao, Stan Y.; Monteiro, José C.; Rinderknecht, W. John; Shen, Amelia H.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1993-01-01)