Burke, Bernard F.; Staelin, David H.; Hewitt, Jacqueline N.; Rosenkranz, Philip W.; Barrett, John W.; Shao, Michael; Wright, Alan; Gaidos, Eric J.; Conner, Samuel R.; Fletcher, André B.; Griffith, Mark R.; Heflin, Michael B.; Herold, Lori K.; Lehar, Joseph; Petro, Michael C.; Quirch, Jo-Ana; Chen, Grace H.; Katz, Charles A.; Ellithorpe, John D.; Ho, Michael S.; Schwartz, Michael J.; Christian, Kevin G.; Delisle, John T.; Leigh, Darren L.; Fieguth, Paul W.; Alkhairy, Ashraf S.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1991-01-01)