| dc.contributor.author |
Macnee, A. B. |
en_US |
| dc.contributor.author |
Bowes, Henry N. |
en_US |
| dc.contributor.author |
Cerrillo, Manuel V. |
en_US |
| dc.contributor.author |
Scott, R. E. |
en_US |
| dc.contributor.author |
Wiesner, Jerome B. |
en_US |
| dc.contributor.author |
Goldman, Stanford |
en_US |
| dc.contributor.author |
Fano, R. M. |
en_US |
| dc.contributor.author |
Redheffer, R. M. |
en_US |
| dc.contributor.author |
David, E. E., Jr. |
en_US |
| dc.contributor.author |
Wallman, Henry |
en_US |
| dc.date.accessioned |
2010-01-13T03:40:14Z |
|
| dc.date.available |
2010-01-13T03:40:14Z |
|
| dc.date.issued |
1947-01-15 |
en_US |
| dc.identifier |
RLE_QPR_004_V |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/50664 |
|
| dc.description |
Contains reports on seven research projects. |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
en_US |
| dc.relation.ispartof |
Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1947 |
en_US |
| dc.relation.ispartof |
Miscellaneous Problems |
en_US |
| dc.relation.ispartofseries |
Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 4 |
en_US |
| dc.rights |
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. |
en_US |
| dc.subject.other |
Study of the R-f Properties of Microwave Generators |
en_US |
| dc.subject.other |
Reflection and Transmission Coefficients |
en_US |
| dc.subject.other |
Miscellaneous Problems |
en_US |
| dc.subject.other |
Electronic Differential Analyzer |
en_US |
| dc.subject.other |
Transient Phenomena in Waveguides |
en_US |
| dc.subject.other |
Electronic Potential Mapping |
en_US |
| dc.subject.other |
Computing Machine for Fourier Transforms |
en_US |
| dc.subject.other |
Broadbanding of a Resonant Impedance |
en_US |
| dc.title |
Miscellaneous Problems |
en_US |
| dc.type |
Technical Report |
en_US |
