Wiesner, Jerome B.; Redheffer, R. M.; Goldman, Stanford; Guillemin, Ernst A.; Bowes, Henry N.; Wallman, Henry; Scott, R. E.; Macnee, A. B.; Chu, L. J.; Cerrillo, Manuel V.; Fano, R. M.; Winter, D. F.; Luttinger, J. M.; David, E. E., Jr.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1947-04-15)