Rapuano, R. A.; Toomey, J. W., Jr.; Klein, M. J.; Nowak, W. B.; Harrison, R. J.; Parshad, R.; Maxwell, E.; Marcus, P. M.; Pellam, J. R.; Tisza, Laszlo; Slater, J. C.; Simon, I.; Ames, S.; Cavileer, R. P. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1948-07-15)