Cavileer, R. P.; Ames, S.; Toomey, J. W., Jr.; Slater, J. C.; Nowak, W. B.; Simon, I.; Pellam, J. R.; Tisza, Laszlo; Harrison, R. J.; Rapuano, R. A.; Klein, M. J.; Parshad, R.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1948-10-15)