Martin, S. T.; Barrett, A. G.; Haus, Hermann A.; Rowe, H. E.; Muehe, C. E., Jr.; Smullin, Louis D.; Houston, J. M.; Stark, L.; Berk, A. D.; Knechtli, R. C.; Boekelheide, A. W.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1952-01-15)