Martin, S. T.; Barrett, A. G.; Muehe, C. E., Jr.; Haus, Hermann A.; Rowe, H. E.; Baghdady, Elie J.; Russell, C. R.; Boekelheide, A. W.; Smullin, Louis D.; Epsztein, B.; Fried, C.; Berk, A. D.; Lax, B. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1952-10-15)