| dc.contributor.author |
Harvey, George G. |
en_US |
| dc.contributor.author |
Goldey, J. M. |
en_US |
| dc.contributor.author |
Thomas, J. B. |
en_US |
| dc.date.accessioned |
2010-02-01T22:18:31Z |
|
| dc.date.available |
2010-02-01T22:18:31Z |
|
| dc.date.issued |
1954-01-15 |
en_US |
| dc.identifier |
RLE_QPR_032_III |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/51143 |
|
| dc.description |
Contains reports on three research projects. |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
en_US |
| dc.relation.ispartof |
Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1954 |
en_US |
| dc.relation.ispartof |
Solid State Physics |
en_US |
| dc.relation.ispartofseries |
Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 32 |
en_US |
| dc.rights |
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. |
en_US |
| dc.subject.other |
Solid State Physics |
en_US |
| dc.subject.other |
Soft X-ray Spectroscopy |
en_US |
| dc.subject.other |
Microwave Study of Semiconductors |
en_US |
| dc.subject.other |
Energy Levels of Impurities in Silicon Carbide |
en_US |
| dc.title |
Solid State Physics |
en_US |
| dc.type |
Technical Report |
en_US |
