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Semiconductor Noise

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Semiconductor Noise

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Author: Ingersoll, J. G.; McWhorter, A. L.; Lull, R. E.; Kosowsky, D. I.; Gross, J.; Hilibrand, J.; Adler, Richard B.; Wiesner, Jerome B.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1954-01-15
Description:
Contains reports on five research projects.
URI: http://hdl.handle.net/1721.1/51155
Other Identifiers: RLE_QPR_032_XII
Is Part Of: Semiconductor Noise
Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1954
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 32
Keywords: Spectrum of Excess Noise from Germanium Filaments, Semiconductor Noise, Modulation Noise in Semiconductor Devices, Noise and Channel Effect in P-N Junction, Problems in the Measurement of Noise Amplitude Probabilities, Introduction

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