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Semiconductor Noise

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Semiconductor Noise

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Author: Bess, L.; Ingersoll, J. G.; Kosowsky, D. I.; Hilibrand, J.; Lull, R. E.; Gross, J.; Wiesner, Jerome B.; McWhorter, A. L.; Adler, Richard B.; Cruz, J. B., Jr.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1955-04-15
Description:
Contains reports on two research projects.
URI: http://hdl.handle.net/1721.1/51279
Other Identifiers: RLE_QPR_037_XI
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1955
Semiconductor Noise
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 37
Keywords: Equipment for Noise Amplitude Probability Distribution Measurements, Semiconductor Noise, Modification of Noise Analyzer

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