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dc.contributor.authorAdler, Richard B.en_US
dc.contributor.authorHaus, Hermann A.en_US
dc.contributor.authorVerma, J. K. D.en_US
dc.contributor.authorHilibrand, J.en_US
dc.date.accessioned2010-03-03T18:45:24Z
dc.date.available2010-03-03T18:45:24Z
dc.date.issued1957-07-15en_US
dc.identifierRLE_WPR_046_XIIen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/52084
dc.descriptionContains reports on three research projects.en_US
dc.description.sponsorshipLincoln Laboratory (Purchase Order DDL-B187)en_US
dc.description.sponsorshipDepartment of the Armyen_US
dc.description.sponsorshipDepartment of the Navyen_US
dc.description.sponsorshipDepartment of the Air Force under Contract AF19(122)-458en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, July 15, 1957en_US
dc.relation.ispartofNoise in Electron Devicesen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 46en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherNoise in Electron Devicesen_US
dc.subject.otherCharacteristic Noise Matrix for Equilibrium Networks and Maser Amplifiersen_US
dc.subject.otherLow-Noise 30-mc Amplifieren_US
dc.subject.otherCharacterization of Probability Distributions for Excess Physical Noiseen_US
dc.titleNoise in Electron Devicesen_US
dc.typeTechnical Reporten_US


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