Allis, W. P.; Hirshfield, J. L.; Bekefi, George; Buchsbaum, S. J.; Mower, L.; Whitehouse, D. R.; Coccoli, J. D.; Hall, R. B.; Glosser, R.; Huguenin, G.; Johansen, P. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1959-07-15)