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Directed random testing

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dc.contributor.advisor Daniel N. Jackson. en_US
dc.contributor.author Pacheco, Carlos, Ph.D. Massachusetts Institute of Technology en_US
dc.contributor.other Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.date.accessioned 2010-03-25T15:27:51Z
dc.date.available 2010-03-25T15:27:51Z
dc.date.copyright 2009 en_US
dc.date.issued 2009 en_US
dc.identifier.uri http://hdl.handle.net/1721.1/53297
dc.description Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2009. en_US
dc.description Cataloged from PDF version of thesis. en_US
dc.description Includes bibliographical references (p. 155-162). en_US
dc.description.abstract Random testing can quickly generate many tests, is easy to implement, scales to large software applications, and reveals software errors. But it tends to generate many tests that are illegal or that exercise the same parts of the code as other tests, thus limiting its effectiveness. Directed random testing is a new approach to test generation that overcomes these limitations, by combining a bottom-up generation of tests with runtime guidance. A directed random test generator takes a collection of operations under test and generates new tests incrementally, by randomly selecting operations to apply and finding arguments from among previously-constructed tests. As soon as it generates a new test, the generator executes it, and the result determines whether the test is redundant, illegal, error-revealing, or useful for generating more tests. The technique outputs failing tests pointing to potential errors that should be corrected, and passing tests that can be used for regression testing. The thesis also contributes auxiliary techniques that post-process the generated tests, including a simplification technique that transforms a, failing test into a smaller one that better isolates the cause of failure, and a branch-directed test generation technique that aims to increase the code coverage achieved by the set of generated tests. Applied to 14 widely-used libraries (including the Java JDK and the core .NET framework libraries), directed random testing quickly reveals many serious, previously unknown errors in the libraries. And compared with other test generation tools (model checking, symbolic execution, and traditional random testing), it reveals more errors and achieves higher code coverage. en_US
dc.description.abstract (cont.) In an industrial case study, a test team at Microsoft using the technique discovered in fifteen hours of human effort as many errors as they typically discover in a person-year of effort using other testing methods. en_US
dc.description.statementofresponsibility by Carlos Pacheco. en_US
dc.format.extent 165 p. en_US
dc.language.iso eng en_US
dc.publisher Massachusetts Institute of Technology en_US
dc.rights M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. en_US
dc.rights.uri http://dspace.mit.edu/handle/1721.1/7582 en_US
dc.subject Electrical Engineering and Computer Science. en_US
dc.title Directed random testing en_US
dc.type Thesis en_US
dc.description.degree Ph.D. en_US
dc.contributor.department Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. en_US
dc.identifier.oclc 549253406 en_US


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