Soft X-Ray Spectroscopy
Citable URI:
http://hdl.handle.net/1721.1/53782
| Title: | Soft X-Ray Spectroscopy |
| Author: | Barrett, H. H.; Billman, K. W. |
| Publisher: | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| Issue Date: | 1962-10-15 |
| Description: | Contains a report on a research project. |
| URI: | http://hdl.handle.net/1721.1/53782 |
| Other Identifiers: | RLE_QPR_067_I |
| Is Part Of | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, October 15, 1962 Soft X-Ray Spectroscopy |
| Series/Report no.: | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 67 |
| Keywords: | Soft X-Ray Spectroscopy, Volumetric Photoelectron Investigation of Nickel |
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| Files | Size | Format | View | |
|---|---|---|---|---|
| RLE_QPR_067_I.pdf | 231.7Kb |
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