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Noise in Electron Devices

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Title: Noise in Electron Devices
Author: Haus, Hermann A.; Penfield, Paul L., Jr.; Rafuse, R. P.; Prabhu, V. K.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Issue Date: 1965-01-15
Description: Contains research objectives and reports on two research projects.
URI: http://hdl.handle.net/1721.1/54051
Other Identifiers: RLE_076_VII
Is Part Of Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, January 15, 1965
General Physics
Noise in Electron Devices
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 76
Keywords: Noise in Electron Devices, Measurement of Amplitude Noise in Optical Cavity Masers, Noise Performance of Abrupt-Junction Varactor Frequency Doubles

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