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Title:
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A 0.7-V 1.8-mW H.264/AVC 720p Video Decoder |
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Author:
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Sze, Vivienne; Finchelstein, Daniel F.; Sinangil, Mahmut E.; Chandrakasan, Anantha P. |
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Department:
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Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Microsystems Technology Laboratories |
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Publisher:
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Institute of Electrical and Electronics Engineers |
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Issue Date:
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2009-10 |
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Abstract:
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The H.264/AVC video coding standard can deliver high compression efficiency at a cost of increased complexity and power. The increasing popularity of video capture and playback on portable devices requires that the power of the video codec be kept to a minimum. This work implements several architecture optimizations such as increased parallelism, pipelining with FIFOs, multiple voltage/frequency domains, and custom voltage-scalable SRAMs that enable low voltage operation to reduce the power of a high-definition decoder. Dynamic voltage and frequency scaling can efficiently adapt to the varying workloads by leveraging the low voltage capabilities and domain partitioning of the decoder. An H.264/AVC Baseline Level 3.2 decoder ASIC was fabricated in 65-nm CMOS and verified. For high definition 720p video decoding at 30 frames per second (fps), it operates down to 0.7 V with a measured power of 1.8 mW, which is significantly lower than previously published results. The highly scalable decoder is capable of operating down to 0.5 V for decoding QCIF at 15 fps with a measured power of 29 muW. |
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URI:
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http://hdl.handle.net/1721.1/55361
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Other Identifiers:
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INSPEC Accession Number: 10957788 |
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ISSN:
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0018-9200 |
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Citation:
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Sze, V. et al. “A 0.7-V 1.8-mW H.264/AVC 720p Video Decoder.” Solid-State Circuits, IEEE Journal of 44.11 (2009): 2943-2956. © 2009 Institute of Electrical and Electronics Engineers. |
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Version:
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Final published version |
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Terms of Use:
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. |
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Published as:
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http://dx.doi.org/10.1109/jssc.2009.2028933
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Journal:
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IEEE Journal of Solid-State Circuits |