X-ray Diffraction Studies
Citable URI:
http://hdl.handle.net/1721.1/55445
| Title: | X-ray Diffraction Studies |
| Author: | Warren, B. E.; Mozzi, R. L. |
| Publisher: | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
| Issue Date: | 1966-04-15 |
| Description: | Contains report on one research project. |
| URI: | http://hdl.handle.net/1721.1/55445 |
| Other Identifiers: | RLE_QPR_081_V |
| Is Part Of | Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1966 General Physics X-ray Diffraction Studies |
| Series/Report no.: | Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 81 |
| Keywords: | X-ray Diffraction Studies, Multiple Scattering of X-rays by Amorphous Samples |
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| Files | Size | Format | View | |
|---|---|---|---|---|
| RLE_QPR_081_V.pdf | 26.91Kb |
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