| dc.contributor.author |
Gruber, J. S. |
en_US |
| dc.contributor.author |
Bedell, G. D., IV |
en_US |
| dc.contributor.author |
Kiparsky, R. P. V. |
en_US |
| dc.date.accessioned |
2010-06-04T21:27:28Z |
|
| dc.date.available |
2010-06-04T21:27:28Z |
|
| dc.date.issued |
1966-04-15 |
en_US |
| dc.identifier |
RLE_QPR_081_XVI |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/1721.1/55456 |
|
| dc.description |
Contains reports on three research projects. |
en_US |
| dc.description.sponsorship |
U. S. Air Force Electronics Systems Division) under Contract AF 19(628)-2487 |
en_US |
| dc.description.sponsorship |
Joint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 36-039-AMC-03200(E) |
en_US |
| dc.description.sponsorship |
National Science Foundation (Grant GP-2495) |
en_US |
| dc.description.sponsorship |
National Institutes of Health (Grant MH-04737-05) |
en_US |
| dc.description.sponsorship |
National Aeronautics and Space Administration (Grant NsG-496) |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) |
en_US |
| dc.relation.ispartof |
Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, April 15, 1966 |
en_US |
| dc.relation.ispartof |
Communication Sciences and Engineering |
en_US |
| dc.relation.ispartof |
Linguistics |
en_US |
| dc.relation.ispartofseries |
Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 81 |
en_US |
| dc.rights |
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. |
en_US |
| dc.subject.other |
Linguistics |
en_US |
| dc.subject.other |
Playing with Distinctive Features in the Babbling of Infants |
en_US |
| dc.subject.other |
Syllable Finals in Chinese Phonology |
en_US |
| dc.subject.other |
Transitive Softening in Russian |
en_US |
| dc.title |
Linguistics |
en_US |
| dc.type |
Technical Report |
en_US |