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Statistical Communication Theory

Research and Teaching Output of the MIT Community

Show simple item record Bose, A. G. en_US Oppenheim, Alan V. en_US Nelsen, D. E. en_US Bruce, J. D. en_US Bauer, R. F. en_US 2010-06-05T04:10:46Z 2010-06-05T04:10:46Z 1966-10-15 en_US
dc.identifier RLE_QPR_083_XI en_US
dc.description Contains reports on three completed research projects and reports on two current research projects. en_US
dc.description.sponsorship Joint Services Electronics Programs (U. S. Army, U. S. Navy, and U. S. Air Force) under Contract DA 36-039-AMC-03200(E) en_US
dc.description.sponsorship National Aeronautics and Space Administration (Grant NsG-496) en_US
dc.description.sponsorship National Science Foundation (Grant GK-835) en_US
dc.description.sponsorship National Aeronautics and Space Administration Grant (NsG-334) en_US
dc.language.iso en en_US
dc.publisher Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) en_US
dc.relation.ispartof Massachusetts Institute of Technology, Research Laboratory of Electronics, Quarterly Progress Report, October 15, 1966 en_US
dc.relation.ispartof Communication Sciences and Engineering en_US
dc.relation.ispartof Statistical Communication Theory en_US
dc.relation.ispartofseries Massachusetts Institute of Technology. Research Laboratory of Electronics. Quarterly Progress Report, no. 83 en_US
dc.rights Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. en_US
dc.subject.other Statistical Communication Theory en_US
dc.subject.other Class-D Amplification of Radiofrequency Amplitude-Modulated Sine Waves en_US
dc.subject.other Spectrum Analysis of the Logarithm of a Function en_US
dc.subject.other Investigation of Time Jitter in Neon Bulb Threshold-Crossing Detectors en_US
dc.subject.other Optimum Quantization of a Two-Level Signal after Contamination By Noise en_US
dc.subject.other Noise in Magnetic Recording Systems Caused by the Recording Tape en_US
dc.title Statistical Communication Theory en_US
dc.type Technical Report en_US

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