Rosenkranz, P. W.; Staelin, David H.; Barath, F. T.; Blinn, J. C., III; Johnston, E. J.; Schwartz, P. R.; Barrett, Alan H.; Waters, J. W.; Barrett, John W.; Myers, P. C.; Papa, D. Cosmo; Schwartz, P. R.; Ewing, M. S.; Batchelor, R. A.; Friefeld, R. D.; Price, R. M. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1970-10-15)