Myers, P. C.; Barrett, Alan H.; Staelin, David H.; Barath, F. T.; Gaut, Norman E.; Kunzi, K. F.; Lenoir, W. B.; Nordberg, W.; Pettyjohn, Ronald L.; Poon, Ronnie K. L.; Rosenkranz, P. W.; Waters, J. W.; Wilcox, R. W.; Anderson, B. G.; Crane, Patrick C.; Giuffrida, Thomas S.; Spencer, J. H.; Burke, Bernard F.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1973-04-15)