Barrett, Alan H.; Staelin, David H.; Lam, Kai-Shue; Ho, P. T.; Martin, R. N.; Bechis, K. P.; Myers, P. C.; Kebabian, P. L.; Kunzi, K. F.; Rosenkranz, P. W.; Waters, J. W.; Price, R. M.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1974-01-15)