Ezekiel, Shaoul; Hackel, Lloyd A.; Youmans, Douglas G.; Grove, Robert E.; Wu, Frederick Y-F.; Miller, John L.; Ross, Arthur H. M.; George, E. Victor; Werner, Charles W.; Hoff, Paul W.; Rhodes, Charles K.; Haus, Hermann A.; Ausschnitt, Christopher P.; Hagelstein, Peter L. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1974-07-15)