Siebert, William M.; Peake, William T.; Weiss, Thomas F.; Braida, Louis D.; Durlach, Nathaniel I.; Lim, Jae S.; Purks, Steven R.; Rabinowitz, William M.; Singer, Elliot; Colburn, H. Steven; Domnitz, Robert H.; Esquissaud, Phillipe; Shepard, Neil T.; Stern, Richard M., Jr.; Walkowski, Yvonne M.; Schultz, Martin C.; Bahler, Lawrence G.; Beguesse, Ian M.; Gluss, David H.; Hicks, Bruce L.; Lippmann, Richard P.; Besen, Peter D.; Golub, Howard L.; Ingard, K. Uno; Houtsma, Adrian J. M.; Henke, William L.; Chow, Mark D.; Boland, Robert P. W.; Allen, John S.; Willett, John C.; Searle, Campbell L.; Cuddy, David R.; Davis, Mark F.; Freeman, Dennis M.; Krasner, Michael A.; Frishkopf, Lawrence S.; Oman, Charles M.; Baden-Kristensen, Keld; Tole, John R.; Wiegner, Allen W.; Conrad, Chester H.; Walters, Joseph B., Jr. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1975-01)