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dc.contributor.authorKong, Jin Auen_US
dc.contributor.authorStaelin, David H.en_US
dc.contributor.authorTsang, Leungen_US
dc.contributor.authorGoss, Blake A.en_US
dc.contributor.authorNjoku, Eni G.en_US
dc.date.accessioned2010-07-15T03:05:04Z
dc.date.available2010-07-15T03:05:04Z
dc.date.issued1975-01en_US
dc.identifierRLE_PR_115_IXen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/56508
dc.descriptionContains research objectives and summary of research on three projects and reports on five research projects.en_US
dc.description.sponsorshipJoint Services Electronics Program (Contract DAAB07-74-C-0630)en_US
dc.description.sponsorshipCalifornia Institute of Technology (Contract 953524)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1975en_US
dc.relation.ispartofGeneral Physicsen_US
dc.relation.ispartofElectrodynamics of Mediaen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 115en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherElectrodynamics of Mediaen_US
dc.subject.otherSubsurface Probing with a Dipole Antennaen_US
dc.subject.otherSubsurface Communication with a Dipole Antennaen_US
dc.subject.otherOptics of Nonisotropic Optical Systemsen_US
dc.subject.otherOptics of Nonisotropic Media Systemsen_US
dc.subject.otherMicrowave Remote Sensing of the Earthen_US
dc.subject.otherStratification Factors for the Highly Conductive Earthen_US
dc.subject.otherVertical Electric Dipole over a Uniaxial Dielectric-Coated Conductoren_US
dc.subject.otherMode Conversion with an Electro-optical Substrateen_US
dc.subject.otherRemote Sensing of Ice Thickness with a Radiometeren_US
dc.subject.otherMicrowave Thermal Emission form Cloudsen_US
dc.titleElectrodynamics of Mediaen_US
dc.typeTechnical Reporten_US


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