Bers, Abraham; Johnston, George L.; Hunter, Kevin; Fisch, Nathaniel J.; Kulp, John L., Jr.; Reitman, Allan H.; Throop, Alan E.; Politzer, Peter A.; Hershcovitch, Ady; Lidsky, Lawrence M.; Pasquarelli, Louis R.; Dupree, Thomas H.; Tetrault, David J.; Bekefi, George; Orzechowski, Thaddeus J.; Maby, Edward W.; Smullin, Louis D.; Freeman, Richard R.; Coppi, Bruno; McCune, James E.; Chrisman, Paul W., Jr.; Fisher, Jay L.; Bromberg, Leslie; Kenyon, Peter T.; Cook, Donald L.; Gottlieb, Mark; Laskey, Kenneth J.; Forbes, Alan R.; Ehst, David A.; Pant, Aniket; Kaplan, David L.; McKinstry, Mark L.; Brewer, Warren K.; Thomas, Clarence E.; Overskei, David O.; Reiman, Allan H.; Kaup, David J.; Karney, Charles F. F.; Chu, Flora Y. F.; Tekula, Miloslav S.; Stone, David S.; Fisher, Alan S.; Richards, Burton (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1976-01)