Peake, William T.; Siebert, William M.; Weiss, Thomas F.; Kiang, Nelson Y-S.; Braida, Louis D.; Durlach, Nathaniel I.; Houtsma, Adrian J. M.; Lim, Jae S.; Rabinowitz, William M.; Colburn, H. Steven; Herman, Philip W., Jr.; Mills, Allen W.; Siegel, Ronald A.; Stern, Richard M., Jr.; Beguesse, Ian M.; Coln, Michael C.; Clements, Mark A.; DeGennaro, Steven V.; Dowdy, Leonard C.; Hicks, Bruce L.; Lippmann, Richard P.; Mook, Douglas R.; Norton, Susan J.; Perlmutter, Yvonne M.; Picheny, Michael A.; Reed, Charlotte M.; Schultz, Martin C.; Villchur, Edgar; Golub, Howard L.; Ordubadi, Afarin; Wicke, Roger W.; Perevoski, Ernest J.; Peterson, Scott K.; Frishkopf, Lawrence S.; Oman, Charles M. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1977-01)