Allen, Jonathan; Devadas, Srinivas; Wyatt, John L., Jr.; Horn, Berthold K. P.; Lee, Hae-Seung; Sodini, Charles G.; Masaki, Ichiro; Rizzo, Joseph F., III; Terman, Christopher J.; Socha, Michael; Shahin, Mohamed; Shire, Douglas; Howard, James; Herndon, Terry O.; Jensen, Ralph; Loewenstein, John; LeBlanc, Danielle; Grumet, Andrew E.; Lichtenstein, Bradley J.; Kelly, Shawn G.; Moss, Joshua D.; Yeddanapudi, Neelima; Cheng, Haigian; Fang, Yajun; Love, Nicole S.; Serafini, Pablo A.; Spaeth, Mark G.; Talib, Zubair; Wang, Ching-Chun; Engels, Daniel W.; Hadjiyiannis, George I.; Hanono, Silvina Z.; Fallah, Farzan
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1997-01-01)