Haus, Hermann A.; Ippen, Erich P.; Fujimoto, James G.; Hagelstein, Peter L.; Bouma, Brett E.; Damask, Jay N.; Grein, Matthew E.; Jones, David J.; Nelson, Lynn E.; Wong, William S.; Matsumoto, Masayuki; Margalit, Moti; Namiki, Shu; Yu, Charles X.; Chou, Patrick C.; Dalal, Ravindra V.; Khan, Mohammed Jalal; Manolatou, Christina; Fleischer, Siegfried B.; Lenz, Gadi; Darwish, Ali M.; Donnelly, Joseph P.; Kolodziejski, Leslie A.; Steinmeyer, Günter; Tziligakis, Constantine N.; Lim, Kuo-Yi; Petrich, Gale S.; Dougherty, David J.; Warlick, Emily L.; House, Jody L.; Ho, Eason; Dresselhaus, Mildred S.; Pevzner, Boris; Bilinsky, Igor P.; Golubovic, Boris; Mikhailov, Victor P.; Stanton, Christopher; Boppart, Stephen A.; Brezinski, Mark E.; Hee, Michael R.; Herrmann, Jürgen; Tearney, Guillermo J.; Swanson, Eric A.; Pitris, Costas; Puliafito, Carmen; Crouch-Baker, Steve; McKubre, Michael; Swartz, Mitchell
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1996-01-01)