Haus, Hermann A.; Ippen, Erich P.; Fujimoto, James G.; Hagelstein, Peter L.; Bouma, Brett E.; Grein, Matthew E.; Jones, David J.; Nelson, Lynn E.; Wong, William S.; Khatri, Farzana I.; Boivin, Luc; Namiki, Shu; Yu, Charles X.; Chen, Jerry C.; Khan, Mohammed Jalal; Little, Brent E.; Kolodziejski, Leslie A.; Smith, Henry I.; Damask, Jay N.; Ferrera, Juan; Lim, Michael H. Y.; Murphy, Thomas E.; Fleischer, Siegfried B.; Lenz, Gadi; Dougherty, David J.; Steinmeyer, Günter; Gellermann, Werner; Darwish, Ali M.; House, Jody L.; Tziligakis, Constantine N.; Bilinsky, Igor P.; Golubovic, Boris; Mikhailov, Viktor P.; Fujimoto, James G.; Stanton, Christopher; Tolk, Norman; Boppart, Stephen A.; Brezinski, Mark E.; Hee, Michael R.; Tearney, Guillermo J.; Swanson, Eric A.; Toth, Cynthia A.; Birngruber, Reginald; Cain, Clarance P.; Noojin, Gary D.; Roach, W. P.; DiCarlo, Cheryl D.; Goodberlet, James G.; Fleury, Marc; Muendel, Martin H.; Hodge, William; Chattevji, Shourov; Crouch-Baker, Steve; McKubre, Michael (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1995-01-01)